• DocumentCode
    2038386
  • Title

    Consideration of impact of GaN HEMT for class E amplifier

  • Author

    Uchiyama, Hiroyuki ; Yamamoto, Ryuta ; Ishikawa, Yusuke ; Suetsugu, Tadashi

  • Author_Institution
    Dept. of Electron. Eng. & Comput. Sci., Fukuoka Univ., Fukuoka, Japan
  • fYear
    2010
  • fDate
    21-24 Nov. 2010
  • Firstpage
    1780
  • Lastpage
    1783
  • Abstract
    This paper demonstrates GaN HEMT as the transistor switch for 13.56 MHz class E amplifier. It is shown that GaN HEMT has capability of realizing very high efficiency class E amplifier at higher frequency than Silicon MOSFETs. Problem of negative threshold voltage, i.e., "normally on" characteristics, is considered. It is considered using second voltage supply, GaN HEMT can be driven properly. Experimental demonstration of 13.56 MHz 1 W class E amplifier achieved 82% efficiency.
  • Keywords
    III-V semiconductors; MOSFET; gallium compounds; high electron mobility transistors; GaN; GaN HEMT; class E amplifier; efficiency 82 percent; frequency 13.56 MHz; negative threshold voltage; power 1 W; silicon MOSFET; transistor switch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2010 - 2010 IEEE Region 10 Conference
  • Conference_Location
    Fukuoka
  • ISSN
    pending
  • Print_ISBN
    978-1-4244-6889-8
  • Type

    conf

  • DOI
    10.1109/TENCON.2010.5686052
  • Filename
    5686052