• DocumentCode
    2038888
  • Title

    High resolution IDDQ characterization and testing-practical issues

  • Author

    Righter, Alan W. ; Soden, Jerry M. ; Beegle, Richard W.

  • Author_Institution
    MCM Applications, Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    259
  • Lastpage
    268
  • Abstract
    IDDQ testing has become an important contributor to quality improvement of CMOS ICs. This paper describes high resolution I DDQ characterization and testing (from the sub-nA to μA level) and outlines test hardware and software issues. The physical basis of IDDQ is discussed. Methods for statistical analysis of IDDQ data are examined, as interpretation of the data is often as important as the measurement itself. Applications of these methods to set reasonable test limits for detecting defective product are demonstrated
  • Keywords
    CMOS digital integrated circuits; electric current measurement; fault diagnosis; integrated circuit testing; production testing; statistical analysis; CMOS IC; IDDQ testing; defective product; statistical analysis; Application software; CMOS integrated circuits; Data analysis; Diodes; Hardware; Laboratories; Microprocessors; Production; Software testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.556970
  • Filename
    556970
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2038888