Title :
High resolution IDDQ characterization and testing-practical issues
Author :
Righter, Alan W. ; Soden, Jerry M. ; Beegle, Richard W.
Author_Institution :
MCM Applications, Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
IDDQ testing has become an important contributor to quality improvement of CMOS ICs. This paper describes high resolution I DDQ characterization and testing (from the sub-nA to μA level) and outlines test hardware and software issues. The physical basis of IDDQ is discussed. Methods for statistical analysis of IDDQ data are examined, as interpretation of the data is often as important as the measurement itself. Applications of these methods to set reasonable test limits for detecting defective product are demonstrated
Keywords :
CMOS digital integrated circuits; electric current measurement; fault diagnosis; integrated circuit testing; production testing; statistical analysis; CMOS IC; IDDQ testing; defective product; statistical analysis; Application software; CMOS integrated circuits; Data analysis; Diodes; Hardware; Laboratories; Microprocessors; Production; Software testing; Voltage;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.556970
