Title :
Optimal tag pattern validation using magnetic resonance imaging
Author :
Denney, Thomas S., Jr. ; Prince, Jerry L. ; Lopez, Michael J. ; Mcveigh, Elliot R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD, USA
Conference_Titel :
Image Processing, 1994. Proceedings. ICIP-94., IEEE International Conference
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-6952-7
