Title :
Multiple output terminal reliability for circuits
Author :
Singh, H. ; Sekhon, H. ; Anneberg, L. ; Yaprak, E. ; Kaur, D.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wayne State Univ., Detroit, MI, USA
Abstract :
A new approach for determining multiple output terminal reliability of communication circuits is proposed. The approach represents the multiple output terminal paths of given circuits in the form of minterms; and then a switching theoretic approach is used so as to result in non-overlapping simplification of multiple output Boolean functions. The technique will give disjoint terms in which the branch reliability value can be substituted and the multiple output reliabilities are determined. One detailed example using the proposed methodology is then presented
Keywords :
Boolean functions; circuit reliability; Boolean function; communication circuit; disjoint term; minterm; multiple output terminal reliability; switching theory; Boolean functions; Communication switching; Proposals; Reliability engineering; Reliability theory; Switching circuits; Tree data structures;
Conference_Titel :
Circuits and Systems, 1996., IEEE 39th Midwest symposium on
Conference_Location :
Ames, IA
Print_ISBN :
0-7803-3636-4
DOI :
10.1109/MWSCAS.1996.594181