DocumentCode :
2039290
Title :
Sensitivity of dual waveguide probe complex permittivity and permeability measurement to probe lift-off error
Author :
Havrilla, M.J. ; Hyde, M.W., IV
Author_Institution :
Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
fYear :
2009
fDate :
14-18 Sept. 2009
Firstpage :
192
Lastpage :
195
Abstract :
The effect of lift-off (i.e., air-gap) error in dual waveguide probe material characterization measurements is presented here. The mitigation of this error using a two-layer dyadic Green´s function analysis is also discussed. Experimental results for gap scenarios of an electromagnetic shielding material are presented for validation purposes.
Keywords :
Green´s function methods; dielectric waveguides; electromagnetic shielding; magnetic permeability measurement; permittivity measurement; dual waveguide probe material; dyadic Green´s function analysis; electromagnetic shielding material; permeability measurement; permittivity measurement; sensitivity analysis; Air gaps; Conducting materials; Dielectric materials; Electromagnetic waveguides; Frequency; Green´s function methods; Permeability measurement; Permittivity measurement; Probes; Waveguide discontinuities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications, 2009. ICEAA '09. International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-3385-8
Electronic_ISBN :
978-1-4244-3386-5
Type :
conf
DOI :
10.1109/ICEAA.2009.5297516
Filename :
5297516
Link To Document :
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