• DocumentCode
    2039388
  • Title

    A manual approach and analysis of Voltage and Frequency Scaling using SCC

  • Author

    Berry, Kenneth ; Navarro, Felipe ; Liu, Chen

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA
  • fYear
    2012
  • fDate
    15-18 March 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The current trend of Dynamic Voltage and Frequency Scaling (DVFS) techniques involve algorithms that predict when a processor is in a period of accessing off chip memory and dial down its voltage/frequency during this phase in order to reduce energy consumption with minimal, if any, effect on execution time. These algorithms often operate with a parameter that defines the tolerable performance degradation, because the various operating frequencies that a processor can be set to are often limited. This limit makes it practically impossible to dial down a processor´s frequency to the exact optimal frequency that will provide maximal energy efficiency but not affect performance. This leads to a need for these algorithms to include the previously stated parameter to identify cases where choices which degrade performance to an unacceptable level and/or without providing a benefit in energy consumption are avoided. However, the overhead costs incurred by the process of voltage and frequency scaling must also be taken into consideration. We propose a study to determine the impact of these overhead costs on the overall benefit of dynamic voltage and frequency scaling.
  • Keywords
    energy conservation; energy consumption; power aware computing; SCC; chip memory assessment; dynamic voltage scaling analysis; energy consumption reduction; exact optimal frequency; frequency scaling analysis; maximal energy efficiency; tolerable performance degradation; Benchmark testing; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon, 2012 Proceedings of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1091-0050
  • Print_ISBN
    978-1-4673-1374-2
  • Type

    conf

  • DOI
    10.1109/SECon.2012.6197073
  • Filename
    6197073