• DocumentCode
    2039429
  • Title

    An exact non-enumerative fault simulator for path-delay faults

  • Author

    Gharaybeh, Marwan A. ; Bushnell, Michael L. ; Agrawal, Vishwani D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    276
  • Lastpage
    285
  • Abstract
    The present an efficient path-delay fault (PDF) simulator that does not involve enumeration of paths. Our method calculates the exact fault coverage, and identifies all tested faults in any circuit with a large number of paths. We present a new data structure, called the Path-Status Graph (PSG), to efficiently hold the status of each PDP in the circuit, i.e., whether or not the PDF is tested. The key to this efficiency is in breaking the information into pieces and distributing it over the data structure and in retaining all or part of the reconverging fanout structure of the circuit in the PSG. Thus, an exponential number of PDFs can share the same piece of information. Using one thousand random tests, we simulated all of the approximately 1020 PDFs in the circuit c6288 and determined that 4.4 billion faults were detected. This number is larger by over three orders of magnitude compared to what was possible with previously reported methods
  • Keywords
    circuit analysis computing; fault diagnosis; integrated circuit modelling; integrated circuit testing; integrated logic circuits; logic testing; random processes; Path-Status Graph; algorithm validation; combinational circuit; data structure; exponential number; fanout structure; non-enumerative fault simulator; path-delay faults; random tests; status invariant transformations; tested faults; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Data structures; Delay; Electrical fault detection; Fault detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.556972
  • Filename
    556972