Nanostructured Materials Studied by Means of the Computed Field Ion Image Tomography (CFIIT)

Author

Wille, Catharina ; Al-Kassab, Talaát ; Heinrich, Alexander ; Kirchheim, Reiner

Author_Institution

Institut fuer Materialphysik, Gottingen Univ.

fYear

2006

fDate

38899

Firstpage

17

Lastpage

18

Abstract

A new technique for transmission electron microscopy and atom probe tomography of nanocrystalline materials is developed based on field ion microscopy (FIM). The computed field ion image tomography (cFIIT) uses stacked field ion micrographs to reconstruct volumes 10² to 10³ times larger than those from tomographic atom probe. This method also makes it possible to create "virtual" FIM images in order to visualise nanoscopic microstructures and provides orientation information to obtain the distances between grain boundary precipitates

Keywords

atom probe field ion microscopy; cobalt; copper; crystal microstructure; grain boundary segregation; nanostructured materials; nickel; transmission electron microscopy; Cu:Co; Ni; atom probe tomography; cFIIT; computed field ion image tomography; field ion microscopy; grain boundary precipitates; microstructures; nanostructured materials; transmission electron microscopy; virtual FIM images; Brightness; Chemical analysis; Grain size; Image analysis; Information analysis; Morphology; Nanostructured materials; Nanostructures; Tomography; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International

Conference_Location

Guilin

Print_ISBN

1-4244-0401-0

Type

conf

DOI

10.1109/IVNC.2006.335312

Filename

4134437