Work Function of Low Index Crystal Facet of Tungsten Evaluated by Seppen-Katamuki Analysis

Author

Gotoh, Y. ; Mukai, K. ; Kawamura, Y. ; Tsuji, H. ; Ishikawa, J.

Author_Institution

Dept. of Electron. Sci. & Eng., Kyoto Univ.

fYear

2006

fDate

38899

Firstpage

27

Lastpage

28

Abstract

In this study, we have investigated the deviation of the electron emission properties from the (011), (111), (121), and (112) facets of the tungsten needle, and examined the validity of our interpretation. It was confirmed that a linear distribution of the F-N characteristics in the S-K chart is under the constant work function, and its slope is proportional to the three halves power of the work function. The Seppen-Katamuki analysis provides a simple, precise, and quick estimation of work function of the field emission device

Keywords

electron field emission; tungsten; work function; (011) facet; (111) facet; (112) facet; (121) facet; Seppen-Katamuki analysis; W; electron emission; field emission device; low index crystal facet; tungsten needle; work function; Apertures; Charge carrier processes; Current measurement; Electron emission; Etching; Fluorescence; Focusing; Needles; Probes; Tungsten;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International

Conference_Location

Guilin

Print_ISBN

1-4244-0401-0

Type

conf

DOI

10.1109/IVNC.2006.335317

Filename

4134442