Title : 
Signal-to-Noise Ratio Measurements of Sound Source and Speaker System-in-Package (SiP)
         
        
            Author : 
Sasaki, Hideki ; Fujimura, Yuki ; Murakami, Tomoo ; Terai, Hiroyuki
         
        
            Author_Institution : 
Syst. Jisso Res. Labs., Kanagawa
         
        
        
        
        
        
            Abstract : 
We have developed a system-in-a-package (SiP) consisting of a sound source LSI and a speaker amplifier LSI for mobile applications, and have measured its signal-to-noise ratio (SNR). The sound source LSI chip is stacked on the speaker amplifier LSI chip with inserting a silicon spacer between these chips. Two types of interposers were applied to the SiP: one-metal polyimide tape and a two-metal glass epoxy board. When the output voltage of the speaker LSI was 5 Vp-p, the SNR of the digital-analog converter in the sound source LSI did not change. When it was 15 Vp-p, the SNR was about 1.5 dB worse than with 5 Vp-p. The SNR when the one-metal tape was used was about 1 dB worse than when the two-metal epoxy board was used. The noise source for this degradation was apparently the class-D amplifier in the speaker LSI. These results should be useful in the design for mixed-signal SiPs.
         
        
            Keywords : 
amplifiers; digital signal processing chips; digital-analogue conversion; large scale integration; mixed analogue-digital integrated circuits; system-in-package; digital-analog converter; metal glass epoxy board; metal polyimide tape; mixed-signal SiP; signal-to-noise ratio measurements; silicon spacer; sound source LSI chip; speaker amplifier LSI chip; speaker system-in-package; Acoustic noise; Digital-analog conversion; Glass; Large scale integration; Loudspeakers; Polyimides; Semiconductor device measurement; Signal to noise ratio; Silicon; Voltage;
         
        
        
        
            Conference_Titel : 
Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
         
        
            Conference_Location : 
Avignon
         
        
            Print_ISBN : 
978-1-4244-2317-0
         
        
            Electronic_ISBN : 
978-1-4244-2318-7
         
        
        
            DOI : 
10.1109/SPI.2008.4558371