Title :
A model driven approach for design and development of a safety critical system
Author_Institution :
QDTE/VSSC/ISRO, Trivandrum, India
Abstract :
Faults in safety critical systems are the important elements to be avoided. To avoid these errors or faults, Fault Tolerant (FT) systems are evolved. But still, some more hidden design faults are not weeded out before realization by traditional and life cycle tests and analysis. In this paper, an approach has been described to find out these types of faults by simulating system architecture with modeling and simulation. By this model based methods, one can enable early verification of the system and quickly find errors or faults and deal with it. This is a very attractive approach, since the systems are critical systems, in which a pre condition that applies to those systems to evaluate or analyze. By doing so, one can test and analyze their system even before hardware as well as software realization. Also, nowadays, the cost of developing a critical system increases exponentially when system design errors are found after the implementation or integration of the system. In this paper, a model driven approach is described for design and development of a safety critical system. The stated approach is described along with functional description of electrical system architecture and the concept of modeling. Self-Checking-Pair (SCP) based computer architecture with high speed communication bus interface is modeled and the performance is evaluated before its hardware and software realization.
Keywords :
hardware-software codesign; program testing; program verification; safety-critical software; software architecture; software fault tolerance; bus interface; computer architecture; fault tolerant; hardware-software realization; hidden design faults; life cycle tests; model driven approach; safety critical systems; self checking pair; system design errors; Analytical models; Computational modeling; Computer architecture; Computers; Fault tolerant systems; Mathematical model; Software; SCP; error; failure; fault; memory; model; processor; system;
Conference_Titel :
Electronics Computer Technology (ICECT), 2011 3rd International Conference on
Conference_Location :
Kanyakumari
Print_ISBN :
978-1-4244-8678-6
Electronic_ISBN :
978-1-4244-8679-3
DOI :
10.1109/ICECTECH.2011.5941847