Self-learning signature analysis for non-volatile memory testing

Author

Olivo, Piero ; Dalpasso, Marcello

Author_Institution

Ist. di Ingegneria, Ferrara Univ., Italy

fYear

1996

fDate

20-25 Oct 1996

Firstpage

303

Lastpage

308

Abstract

A new BIST scheme suitable for on-chip testing of non-volatile memories and based on signature analysis is presented. The signature of the whole memory, whose content can be selectively changed by the user, is dynamically self-learned by the memory and it is saved in a dedicated memory location. Such a signature can be externally compared with the expected one in order to check for the programming operation, or it can be used for self-test when data retention must be checked

Keywords

automatic testing; built-in self test; error analysis; integrated circuit testing; integrated memory circuits; logic testing; BIST scheme; data retention checking; dedicated memory location; nonvolatile memory testing; onchip testing; programming operation checking; self-learning signature analysis; self-testing; Automatic testing; Built-in self-test; Circuit testing; Error correction; Error correction codes; Integrated circuit modeling; Logic programming; Nonvolatile memory; Performance evaluation; Power system reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1996. Proceedings., International

Conference_Location

Washington, DC

ISSN

1089-3539

Print_ISBN

0-7803-3541-4

Type

conf

DOI

10.1109/TEST.1996.556975

Filename

556975

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2040235