DocumentCode
2040484
Title
Analytical Characterization of CPW-to-Microstrip Transitions Used in RF Test Structures
Author
Torres-Torres, Reydezel
Author_Institution
Electron. Dept., Inst. Nac. de Astrofis., Puebla
fYear
2008
fDate
12-15 May 2008
Firstpage
1
Lastpage
4
Abstract
A method for characterizing coplanar-waveguide (CPW) to microstrip transitions is presented in this paper. The method takes into account the coupling between the signal and ground pads and allows the analytical extraction of physically meaningful parameters for the transition model. The formulation of the method is based on a simple but rigorous analysis of the ABCD-parameters of two lines differing only in length. Simulations using a model incorporating the extracted parameters agree well with experimental data up to 30 GHz, validating the proposed method.
Keywords
coplanar waveguides; microstrip transitions; testing; CPW; RF test structure; coplanar waveguide; microstrip transition; Circuit simulation; Circuit testing; Coplanar waveguides; Data mining; Equivalent circuits; Fixtures; Microstrip; Radio frequency; Scattering parameters; Signal analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
Conference_Location
Avignon
Print_ISBN
978-1-4244-2317-0
Electronic_ISBN
978-1-4244-2318-7
Type
conf
DOI
10.1109/SPI.2008.4558390
Filename
4558390
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