DocumentCode
2040504
Title
Scanning Atom-Probe Analysis of Carbon-Based Materials
Author
Nishikawa, Osamu ; Taniguchi, Masahiro
Author_Institution
Dept. of Chem. & Biol., Kanazawa Inst. of Technol.
fYear
2006
fDate
38899
Firstpage
67
Lastpage
68
Abstract
A new type of atom probe named as the scanning atom probe was used to analyze the mass spectra of carbon nanotubes and some organic molecules
Keywords
atom probe field ion microscopy; carbon nanotubes; mass spectroscopy; organic compounds; C; carbon nanotubes; carbon-based materials; mass spectra; organic molecules; scanning atom-probe analysis; Atomic measurements; Biochemical analysis; Biological materials; Chemistry; Electrodes; Hydrogen; Organic materials; Position sensitive particle detectors; Powders; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location
Guilin
Print_ISBN
1-4244-0401-0
Type
conf
DOI
10.1109/IVNC.2006.335355
Filename
4134462
Link To Document