Title :
Analysis of Field Emission Operation-induced Defects in Carbon Nanotube via a Combination of Field Emission Measurement and Raman Spectroscopy
Author :
Lee, Yeonju ; Lee, Sora ; Duk Young Jeon
Author_Institution :
Dept. of Mater. Sci. & Eng., Korea Adv. Inst. of Sci. & Technol., Daejeon
Abstract :
The field emission operation-induced defects in carbon nanotube are analyzed using a combination of field emission measurement and Raman spectroscopy. The preparation-induced mechanical defects are minimized. It was observed that the field-emission operation-induced defects are generated at the early stage of operation followed by aging at about 10 min after the operation
Keywords :
Raman spectra; ageing; carbon nanotubes; field emission; C; Raman spectroscopy; aging; carbon nanotube; field emission operation-induced defects; preparation-induced mechanical defects; Carbon nanotubes; Cathodes; Current measurement; Density measurement; Materials science and technology; Mechanical factors; Mechanical variables measurement; Raman scattering; Spectroscopy; Time measurement;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
DOI :
10.1109/IVNC.2006.335366
