DocumentCode
2040686
Title
Ion temperature measurement by using H/sub /spl alpha// line broadening in Hanbit mirror device
Author
Yoo, Seung J. ; Ko, Wen H. ; Yang, Hsiuhan Lexie
Author_Institution
Korea Basic Sci. Inst., Daejeon, South Korea
fYear
2003
fDate
5-5 June 2003
Firstpage
487
Abstract
Summary form only given, as follows. Ion temperatures are determined from H/spl alpha/ line broadening measured by charge exchange recombination spectroscopy (CXRS) on Hanbit, a mirror device. The measured H/spl alpha/ line profile consists of the charge exchange emission of hot ions in plasma core and the emission from hydrogen atoms in plasma edges. Since the edge emission contributes to the line center and is relatively much larger than that of the charge exchange emission of hot ions, the line shape of the latter is submerged into the former when measured by an array detector such as a CCD detector. So, an optical fiber array detector has been developed in order to block out the central region of the line profile and to obtain a pure charge exchange line shape. The concept of the optical fiber array detector is described and the result of the ion temperature measurement is presented.
Keywords
charge exchange; magnetic mirrors; plasma boundary layers; plasma diagnostics; plasma temperature; spectral line broadening; spectral methods of temperature measurement; H/spl alpha/ line broadening; Hanbit mirror device; charge exchange emission; hot ions; ion temperature measurement; optical fiber array detector; plasma core; plasma edges; Atomic measurements; Charge measurement; Current measurement; Optical arrays; Plasma devices; Plasma measurements; Plasma temperature; Sensor arrays; Shape measurement; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on
Conference_Location
Jeju, South Korea
ISSN
0730-9244
Print_ISBN
0-7803-7911-X
Type
conf
DOI
10.1109/PLASMA.2003.1230106
Filename
1230106
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