DocumentCode :
2040826
Title :
Plasmonic, Carbon Nanotube and Conventional nano-interconnects: a comparison of propagation properties
Author :
Maffucci, A. ; Miano, G. ; Rubinacci, G. ; Tamburrino, A. ; Villone, F.
Author_Institution :
DAEIMI, Univ. di Cassino, Cassino
fYear :
2008
fDate :
12-15 May 2008
Firstpage :
1
Lastpage :
4
Abstract :
The scaling of the integrated circuits foreseen by the technology roadmap imposes tight requirements to the interconnects, in terms of latency, energy density and bandwidth. Innovative solutions are proposed to replace the traditional copper technology at nanometric scale. In this paper we investigate the behavior of some of these innovative interconnects, namely carbon nanotube interconnects, arrays of plasmonic nanoparticles and surface plasmon-polariton waveguides. Starting from the electrodynamic models describing such structures, the performances in terms of latency and decay lengths are compared.
Keywords :
carbon nanotubes; integrated circuit interconnections; nanoparticles; plasmonics; polaritons; surface plasmons; carbon nanotube interconnects; copper technology; electrodynamic models; energy density; integrated circuits; nanointerconnects; plasmonic interconnects; plasmonic nanoparticles; propagation properties; surface plasmon-polariton waveguides; Bandwidth; Carbon nanotubes; Copper; Delay; Electrodynamics; Integrated circuit interconnections; Integrated circuit technology; Nanoparticles; Plasmons; Surface waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Propagation on Interconnects, 2008. SPI 2008. 12th IEEE Workshop on
Conference_Location :
Avignon
Print_ISBN :
978-1-4244-2317-0
Electronic_ISBN :
978-1-4244-2318-7
Type :
conf
DOI :
10.1109/SPI.2008.4558406
Filename :
4558406
Link To Document :
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