DocumentCode :
2040894
Title :
Defect and fault tolerance of reconfigurable molecular computing
Author :
Tahoori, Mehdi B. ; Mitra, Subhasish
Author_Institution :
Northeastern Univ., Boston, MA, USA
fYear :
2004
fDate :
20-23 April 2004
Firstpage :
176
Lastpage :
185
Abstract :
Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of reconfigurable molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware. In this paper, we demonstrate how test and diagnosis techniques originally developed for FPGAs can be used in the context of molecular computing.
Keywords :
built-in self test; fault diagnosis; fault tolerance; field programmable gate arrays; logic testing; reconfigurable architectures; sequential circuits; FPGA; defect tolerance; fault detection; fault diagnosis; fault tolerance; manufacturing defects; reconfigurable molecular computing system; run time errors; Fault detection; Fault diagnosis; Fault tolerance; Fault tolerant systems; Hardware; Manufacturing; Molecular computing; Protection; Robustness; Runtime;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Field-Programmable Custom Computing Machines, 2004. FCCM 2004. 12th Annual IEEE Symposium on
Print_ISBN :
0-7695-2230-0
Type :
conf
DOI :
10.1109/FCCM.2004.26
Filename :
1364628
Link To Document :
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