Defect and fault tolerance of reconfigurable molecular computing

Author

Tahoori, Mehdi B. ; Mitra, Subhasish

Author_Institution

Northeastern Univ., Boston, MA, USA

fYear

2004

fDate

20-23 April 2004

Firstpage

176

Lastpage

185

Abstract

Fault detection and diagnosis techniques that are essential for defect tolerance, fault tolerance and self-repair of reconfigurable molecular computing systems are discussed. These techniques enable robust molecular computing system design protected from manufacturing defects and run-time errors in the underlying hardware. In this paper, we demonstrate how test and diagnosis techniques originally developed for FPGAs can be used in the context of molecular computing.

Keywords

built-in self test; fault diagnosis; fault tolerance; field programmable gate arrays; logic testing; reconfigurable architectures; sequential circuits; FPGA; defect tolerance; fault detection; fault diagnosis; fault tolerance; manufacturing defects; reconfigurable molecular computing system; run time errors; Fault detection; Fault diagnosis; Fault tolerance; Fault tolerant systems; Hardware; Manufacturing; Molecular computing; Protection; Robustness; Runtime;

fLanguage

English

Publisher

ieee

Conference_Titel

Field-Programmable Custom Computing Machines, 2004. FCCM 2004. 12th Annual IEEE Symposium on

Print_ISBN

0-7695-2230-0

Type

conf

DOI

10.1109/FCCM.2004.26

Filename

1364628

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2040894