• DocumentCode
    2040956
  • Title

    Analog/digital testing of loaded boards without dedicated test points

  • Author

    Vaucher, Christophe ; Balme, Louis

  • Author_Institution
    Tru Test Techniques & Training, Bandol, France
  • fYear
    1996
  • fDate
    20-25 Oct 1996
  • Firstpage
    325
  • Lastpage
    332
  • Abstract
    This paper describes a new way to consider loaded board test fixturing, meeting the challenges of testing high density analog/digital loaded boards, such as mobile phones, camescopes, PCMCIA or fax boards. This method allows board area space savings of 7 to 15%
  • Keywords
    printed circuit testing; probes; test equipment; EC probes; PCMCIA boards; analog/digital boards; analog/digital testing; board test fixturing; camescope boards; elastical conductive probes; fax boards; high density boards; loaded boards; mobile phone boards; nondedicated test points; Fixtures; Floods; Manufacturing; Mass production; Mobile handsets; Printing; Probes; Springs; Testing; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1996. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-3541-4
  • Type

    conf

  • DOI
    10.1109/TEST.1996.556978
  • Filename
    556978
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2040956