Title :
Analog/digital testing of loaded boards without dedicated test points
Author :
Vaucher, Christophe ; Balme, Louis
Author_Institution :
Tru Test Techniques & Training, Bandol, France
Abstract :
This paper describes a new way to consider loaded board test fixturing, meeting the challenges of testing high density analog/digital loaded boards, such as mobile phones, camescopes, PCMCIA or fax boards. This method allows board area space savings of 7 to 15%
Keywords :
printed circuit testing; probes; test equipment; EC probes; PCMCIA boards; analog/digital boards; analog/digital testing; board test fixturing; camescope boards; elastical conductive probes; fax boards; high density boards; loaded boards; mobile phone boards; nondedicated test points; Fixtures; Floods; Manufacturing; Mass production; Mobile handsets; Printing; Probes; Springs; Testing; Wiring;
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-3541-4
DOI :
10.1109/TEST.1996.556978
