Title :
CuO Nanowire Arrays: Preparation, Characterization and Field Emission Properties
Author :
Chen, J. ; Zhang, S.M. ; Li, C.Y. ; Liu, X. ; Deng, S.Z. ; Xu, N.S.
Author_Institution :
State Key Lab. of Optoelectron. Mater. & Technol., Zhongshan Univ., Guangzhou
Abstract :
Well-aligned CuO nanowire arrays were grown using a thermal oxidation method at temperatures ranging from 350 to 650degC. Morphology and structure characterization was done by field emission scanning electron microscopy, high resolution transmission electron microscopy and selected area electron diffraction, while composition and electronic structure was studied by X-ray diffraction, Raman spectroscopy, X-ray photoelectron spectroscopy and ultraviolet photoelectron spectroscopy. Field emission properties including current-applied field characteristics, emission uniformity and temperature dependence are tested in a ultrahigh vacuum system
Keywords :
Raman spectra; X-ray diffraction; X-ray photoelectron spectra; copper compounds; electron diffraction; electronic structure; field emission electron microscopy; nanotechnology; nanowires; oxidation; scanning electron microscopy; transmission electron microscopy; ultraviolet photoelectron spectra; 350 to 650 degC; CuO; Raman spectroscopy; X-ray diffraction; X-ray photoelectron spectroscopy; chemical composition; current-applied field properties; electronic structure; field emission scanning electron microscopy; field emission uniformity; high resolution transmission electron microscopy; morphological properties; selected area electron diffraction; structural properties; temperature dependence; thermal oxidation; ultrahigh vacuum system; ultraviolet photoelectron spectroscopy; well-aligned nanowire arrays; Electron emission; Morphology; Oxidation; Photoelectron microscopy; Raman scattering; Scanning electron microscopy; Spectroscopy; Temperature distribution; Transmission electron microscopy; X-ray diffraction;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
DOI :
10.1109/IVNC.2006.335383
