Title :
Why Nano-DSP Will be Fan-In Constrained
Author :
Ibrahim, Walid ; Beiu, Valeriu ; Molnar, Sanja Lazarova
Author_Institution :
Coll. of Inf. Technol., UAE Univ., United Arab Emirates
Abstract :
This paper studies for the first time the performance of von-Neumann multiplexing (vN-MUX) when stuck at fault model is considered. In this study, vN-MUX is applied to majority (MAJ) gates of small fan-ins (¿ = 3, 5, 7, and 9), and respectively the corresponding redundancy factors (R = 6, 10, 14, and 18). This study is extremely important for a deeper understanding of vN-MUX, especially when considering the unreliable behavior of future nano-devices. The analysis confirms and enhances on well-known theoretical results, and is exact as being obtained using Bayesian network. Finally, the extension to device level will allow us to characterize vN-MUX with respect device failures for the first time ever. The results are very timely and are explaining a strange (non-linear) behavior of vN-MUX that was first reported two years ago (based on extensive Monte Carlo simulations).
Keywords :
belief networks; multiplexing; nanotechnology; redundancy; Bayesian network; fan-in constrained; nano-DSP; redundancy factors; von-Neumann multiplexing; Bayesian methods; CMOS technology; Circuits; Educational institutions; Information technology; Nanoelectronics; Performance analysis; Redundancy; Signal processing; Uncertainty; Bayesian Networks; majority gates; nanoelectronics; reliability; von-Neumann multiplexing;
Conference_Titel :
Signal Processing and Communications, 2007. ICSPC 2007. IEEE International Conference on
Conference_Location :
Dubai
Print_ISBN :
978-1-4244-1235-8
Electronic_ISBN :
978-1-4244-1236-5
DOI :
10.1109/ICSPC.2007.4728319
