Title :
Gray-level-based corner detection by using wavelet transform
Author :
Jiann-Shu Lee ; Yung-Nien Sun ; Chin-Hsing Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
Corners are very attractive features for many applications in computer vision. In this paper, a novel gray-level corner detection algorithm based on the wavelet transform is presented. First, we derived several properties of the corner and the edge embedded in the wavelet domain. Next, we apply these similar properties between the corner and the edge to extract the edge image. Then we employed these different properties between the corner and the edge to locate corners. Experiments have shown that our algorithm can detect corners accurately and effectively.<>
Keywords :
computer vision; edge detection; wavelet transforms; computer vision; edge; edge image extraction; gray-level-based corner detection; wavelet domain; wavelet transform; Application software; Computer vision; Data mining; Detection algorithms; Humans; Image edge detection; Image segmentation; Signal processing algorithms; Wavelet domain; Wavelet transforms;
Conference_Titel :
TENCON '93. Proceedings. Computer, Communication, Control and Power Engineering.1993 IEEE Region 10 Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-1233-3
DOI :
10.1109/TENCON.1993.320175