Title :
Dynamic hysteresis in Finemet thin films
Author :
Santi, L. ; Magni, A. ; Durin, G. ; Sommer, R.L. ; Colaiori, F. ; Zapperi, S.
Author_Institution :
Ist. Elettrotecnico Nazionale Galileo Ferraris, Torino, Italy
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we present a series of dynamic measurements on a set of Finemet thin films, having thickness ranging from 200 /spl Aring/ to 5 /spl mu/m, by using both magneto-optical Kerr effect (MOKE) and the fluxmetric inductive method. Unexpectedly, the data show two completely different hysteresis behavior, showing relevant differences in their frequency dependences. In particular, optical hysteresis is easily explained by a simple depinning model which can be solved analytically.
Keywords :
Kerr magneto-optical effect; amorphous magnetic materials; boron alloys; copper alloys; ferromagnetic materials; iron alloys; magnetic hysteresis; magnetic thin films; niobium alloys; silicon alloys; 200 /spl Aring/ to 5 micron; FeCuNbSiB; amorphous magnetic materials; depinning model; dynamic hysteresis; finemet thin films; fluxmetric inductive method; frequency dependency; magneto-optical Kerr effect; optical hysteresis; Frequency dependence; Magnetic domain walls; Magnetic films; Magnetic hysteresis; Magnetic multilayers; Magnetooptic effects; Physics; Temperature; Thickness measurement; Transistors;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230259
