Title :
Eigen modes and ferromagnetic resonance line width of inhomogeneous thin films
Author :
McMichael, R.D. ; Kunz, Andreas ; Twisselmann, D.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we describe modeling of the effects of magnetic inhomogeneity on ferromagnetic resonance line width using eigen mode analyses of inhomogeneous thin magnetic films.
Keywords :
Permalloy; ferromagnetic materials; ferromagnetic resonance; inhomogeneous media; magnetic thin films; metallic thin films; spectral line breadth; FeNi; eigen mode; ferromagnetic resonance line width; inhomogeneous thin films; magnetic inhomogeneity; magnetic thin films; modeling; Damping; Grain size; Magnetic analysis; Magnetic devices; Magnetic films; Magnetic resonance; Magnetization; Microstructure; Thick films; Transistors;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230262
