DocumentCode
2041314
Title
Surveillance Fma On A Semiconductor Laser Line - A Case Study
Author
Heffner, William R.
Author_Institution
AT&T Microelectronics
fYear
1992
fDate
16-19 Nov 1992
Firstpage
573
Lastpage
573
Keywords
Certification; Computer aided software engineering; Condition monitoring; Costs; Laser modes; Microelectronics; Oceans; Production systems; Semiconductor lasers; Surveillance;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS '92, Conference Proceedings. IEEE Lasers and Electro-Optics Society, 1992 Annual Meeting
Print_ISBN
0-7803-0526-4
Type
conf
DOI
10.1109/LEOS.1992.694099
Filename
694099
Link To Document