DocumentCode :
2041457
Title :
A roadmap for boundary-scan test reuse
Author :
Wedge, Gene ; Conner, Tom
Author_Institution :
VICTORY Software Dev., Teradyne Inc., USA
fYear :
1996
fDate :
20-25 Oct 1996
Firstpage :
340
Lastpage :
346
Abstract :
This paper proposes a layered model for boundary-scan testing to help identify opportunities for standardization. Serial vector format and an accompanying application programming interface, developed for the Application Specific Electronic Module (ASEM) project sponsored by ARPA, are presented as examples of a novel approach to the representation of standards for the ATE industry
Keywords :
IEEE standards; automatic test equipment; automatic test software; boundary scan testing; measurement standards; standardisation; ARPA; ASEM project; ATE standards; application programming interface; boundary-scan test reuse; layered model; serial vector format; standardization; Application software; Assembly; Circuit testing; Computer aided manufacturing; Electronics industry; Foundries; Industrial electronics; Programming; Standardization; Standards development;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1996. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-3541-4
Type :
conf
DOI :
10.1109/TEST.1996.556980
Filename :
556980
Link To Document :
بازگشت