DocumentCode
2041457
Title
A roadmap for boundary-scan test reuse
Author
Wedge, Gene ; Conner, Tom
Author_Institution
VICTORY Software Dev., Teradyne Inc., USA
fYear
1996
fDate
20-25 Oct 1996
Firstpage
340
Lastpage
346
Abstract
This paper proposes a layered model for boundary-scan testing to help identify opportunities for standardization. Serial vector format and an accompanying application programming interface, developed for the Application Specific Electronic Module (ASEM) project sponsored by ARPA, are presented as examples of a novel approach to the representation of standards for the ATE industry
Keywords
IEEE standards; automatic test equipment; automatic test software; boundary scan testing; measurement standards; standardisation; ARPA; ASEM project; ATE standards; application programming interface; boundary-scan test reuse; layered model; serial vector format; standardization; Application software; Assembly; Circuit testing; Computer aided manufacturing; Electronics industry; Foundries; Industrial electronics; Programming; Standardization; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1996. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-3541-4
Type
conf
DOI
10.1109/TEST.1996.556980
Filename
556980
Link To Document