Title :
Image stitch algorithm based on SIFT and MVSC
Author :
Hua, Zhen ; Li, Yewei ; Li, Jinjiang
Author_Institution :
Coll. of Inf. & Electron. Eng., Shandong Inst. of Economic & Techonlogy, Yantai, China
Abstract :
Based on scale-invariant feature transform (SIFT) and mean seamless cloning (MVSC), an image stitching algorithm is presented, to improve the quality of the panoramic stiching image. Using SIFT algorithm to extract between benchmark images (await matched image) and follow-up images(with the baseline image match the image) of the feature points, identifying locations and directions, using 128 dimensional vector to describe features point. Using the nearest neighbor method to achieve two images feature point matching, identify overlap regions. Using SIFT algorithm to provide benchmark images and follow-up images to determine the source cloning domain and target cloning domain of the MVSC. Using the mean value coordinates to achieve the pixel to interpolat from the source cloning domain to target cloning domain. Finally, using MVSC algorithm to achieve the two images stitching. Experiment results shows that this method with regard to image rotation, perspective changes and image scaling to have a very good stitching results, stitching image is complete information, the quality of the image is high.
Keywords :
feature extraction; image matching; transforms; MVSC source cloning domain; MVSC target cloning domain; SIFT algorithm; await matched image; baseline image match; feature point matching; image extraction; image rotation; image scaling; image stitch algorithm; mean seamless cloning; mean value coordinates; nearest neighbor method; panoramic stiching image; scale-invariant feature transform; Algorithm design and analysis; Cloning; Feature extraction; Image fusion; Image matching; Pixel; Transforms; image matching; image stitching; mean value seamless cloning (MVSC); scale-invariant feature transform (SIFT);
Conference_Titel :
Fuzzy Systems and Knowledge Discovery (FSKD), 2010 Seventh International Conference on
Conference_Location :
Yantai, Shandong
Print_ISBN :
978-1-4244-5931-5
DOI :
10.1109/FSKD.2010.5569813