DocumentCode
2041847
Title
Atom probe tomography of GB segregation in nanocrystalline Ni alloy
Author
Qian, L.H. ; Chen, M.W. ; Miller, Michael K. ; Kuwano, S. ; Fujikawa, Y. ; Miller, Michael K. ; Sakurai, T.
Author_Institution
Inst. for Mater. Res., Tohoku Univ., Sendai
fYear
2006
fDate
17-20 July 2006
Firstpage
177
Lastpage
177
Abstract
In this study, atom probe tomography was employed to investigate atomic-scale element distributions in an electroplated nanocrystalline Ni alloy. Quantitative characterization evidences that weak yet detectable grain boundary segregations of carbon and cobalt occur during low-temperature electroplating. Nanoindentation measurements suggest that the hardness of the alloy is ~1 GPa higher than that of the nanocrystalline pure Ni with the same grain size. Classical solid solution strengthening cannot completely account for the hardness increment and hence the grain boundary segregations appear to play an important role in the strength improvement.
Keywords
cobalt alloys; electroplating; grain boundary segregation; hardness; indentation; iron alloys; nanostructured materials; nickel alloys; tomography; NiCoCFeS; atom probe tomography; atomic-scale element distributions; electroplating; grain boundary segregation; hardness; nanocrystalline Ni alloy; nanoindentation; Atomic measurements; Chemical elements; Cobalt; Grain boundaries; Grain size; Nickel alloys; Probes; Size measurement; Solids; Tomography;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location
Guilin
Print_ISBN
1-4244-0401-0
Type
conf
DOI
10.1109/IVNC.2006.335416
Filename
4134518
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