• DocumentCode
    2041847
  • Title

    Atom probe tomography of GB segregation in nanocrystalline Ni alloy

  • Author

    Qian, L.H. ; Chen, M.W. ; Miller, Michael K. ; Kuwano, S. ; Fujikawa, Y. ; Miller, Michael K. ; Sakurai, T.

  • Author_Institution
    Inst. for Mater. Res., Tohoku Univ., Sendai
  • fYear
    2006
  • fDate
    17-20 July 2006
  • Firstpage
    177
  • Lastpage
    177
  • Abstract
    In this study, atom probe tomography was employed to investigate atomic-scale element distributions in an electroplated nanocrystalline Ni alloy. Quantitative characterization evidences that weak yet detectable grain boundary segregations of carbon and cobalt occur during low-temperature electroplating. Nanoindentation measurements suggest that the hardness of the alloy is ~1 GPa higher than that of the nanocrystalline pure Ni with the same grain size. Classical solid solution strengthening cannot completely account for the hardness increment and hence the grain boundary segregations appear to play an important role in the strength improvement.
  • Keywords
    cobalt alloys; electroplating; grain boundary segregation; hardness; indentation; iron alloys; nanostructured materials; nickel alloys; tomography; NiCoCFeS; atom probe tomography; atomic-scale element distributions; electroplating; grain boundary segregation; hardness; nanocrystalline Ni alloy; nanoindentation; Atomic measurements; Chemical elements; Cobalt; Grain boundaries; Grain size; Nickel alloys; Probes; Size measurement; Solids; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
  • Conference_Location
    Guilin
  • Print_ISBN
    1-4244-0401-0
  • Type

    conf

  • DOI
    10.1109/IVNC.2006.335416
  • Filename
    4134518