Title :
Annealing-induced properties of Al-N-M (M: Co, Fe) thin films
Author :
Roy, Anup G. ; Nittono, Osamu
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this study, we focus on nanocrystalline granular films in which small metal particle of nanometer size are embedded in an insulator matrix. We present here annealing induced magnetic and electric properties for the films with different compositions. The structure and the microstructure of these films were examined by X-ray diffraction and transmission electron microscopy. Magnetic and electrical properties were measured by a vibrating sample magnetometer and a four-probe method respectively.
Keywords :
X-ray diffraction; aluminium alloys; annealing; cobalt alloys; coercive force; crystal microstructure; electrical resistivity; ferromagnetic materials; iron alloys; magnetic thin films; nanostructured materials; transmission electron microscopy; AlNCoFe; TEM; X-ray diffraction; XRD; annealing; electric properties; four-probe method; insulator matrix; magnetic properties; magnetometry; metal particle; microstructure; nanocrystalline granular films; thin films; transmission electron microscopy; Annealing; Electrons; Insulation; Iron; Magnetic films; Magnetic properties; Metal-insulator structures; Microstructure; Transistors; X-ray diffraction;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230282
