Annealing-induced properties of Al-N-M (M: Co, Fe) thin films

Author

Roy, Anup G. ; Nittono, Osamu

Author_Institution

Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA

fYear

2003

fDate

March 30 2003-April 3 2003

Abstract

In this study, we focus on nanocrystalline granular films in which small metal particle of nanometer size are embedded in an insulator matrix. We present here annealing induced magnetic and electric properties for the films with different compositions. The structure and the microstructure of these films were examined by X-ray diffraction and transmission electron microscopy. Magnetic and electrical properties were measured by a vibrating sample magnetometer and a four-probe method respectively.

Keywords

X-ray diffraction; aluminium alloys; annealing; cobalt alloys; coercive force; crystal microstructure; electrical resistivity; ferromagnetic materials; iron alloys; magnetic thin films; nanostructured materials; transmission electron microscopy; AlNCoFe; TEM; X-ray diffraction; XRD; annealing; electric properties; four-probe method; insulator matrix; magnetic properties; magnetometry; metal particle; microstructure; nanocrystalline granular films; thin films; transmission electron microscopy; Annealing; Electrons; Insulation; Iron; Magnetic films; Magnetic properties; Metal-insulator structures; Microstructure; Transistors; X-ray diffraction;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2003. INTERMAG 2003. IEEE International

Conference_Location

Boston, MA, USA

Print_ISBN

0-7803-7647-1

Type

conf

DOI

10.1109/INTMAG.2003.1230282

Filename

1230282