DocumentCode :
2041912
Title :
Compositional Variations of Co-based Thin films for Biasing Magnets in GMR/TMR Read Heads
Author :
Pinitsoontorn, S. ; Cerezo, A. ; Petford-Long, A.K.
Author_Institution :
Dept. of Mater., Oxford Univ.
fYear :
2006
fDate :
38899
Firstpage :
183
Lastpage :
184
Abstract :
A combination of several techniques including transmission electron microscopy, X-ray diffraction, and 3DAP are used to characterize ion beam deposited Co70Cr10Pt20 thin films on Cr seed layers. The films are deposited at two different angles, 0 and 25deg. Results show increased coercivity, lower stress and smaller average grain size for the film deposited at a larger deposition angle
Keywords :
X-ray diffraction; chromium alloys; cobalt alloys; coercive force; giant magnetoresistance; grain size; ion beam assisted deposition; magnetic heads; magnetic thin films; permanent magnets; platinum alloys; transmission electron microscopy; tunnelling magnetoresistance; 3DAP; CoCrPt; GMR/TMR read head biasing magnets; X-ray diffraction; coercivity; grain size; internal stresses; magnetic thin films; seed layers; transmission electron microscopy; Chromium; Coercive force; Electron beams; Ion beams; Magnetic heads; Magnets; Sputtering; Transistors; Transmission electron microscopy; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
Type :
conf
DOI :
10.1109/IVNC.2006.335419
Filename :
4134521
Link To Document :
بازگشت