DocumentCode :
2041963
Title :
Laser Assisted Atom Probe: Toward the Analyze of Non-Metallic Material
Author :
Gilbert, M. ; Deconihout, B.
Author_Institution :
CNRS, Rouen Univ., Mont Saint Aignan
fYear :
2006
fDate :
38899
Firstpage :
189
Lastpage :
189
Abstract :
Laser assisted atom probe technique is reported which differs from the conventional atom probe analysis in the use of ultra fast sub nanosecond laser pulses instead of electrical evaporation pulsed. This method proves to be advantageous in analyzing oxide type materials like manganites, superconductors and even in the conducting phase of highly resistant silicon
Keywords :
atom probe field ion microscopy; laser materials processing; conducting phase; highly resistant silicon; laser assisted atom probe; manganites; oxides; superconductors; ultra fast sub nanosecond laser pulses; Atom lasers; Atomic beams; Conducting materials; Optical materials; Optical pulses; Probes; Resistance; Silicon; Superconducting materials; Superconductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
Type :
conf
DOI :
10.1109/IVNC.2006.335422
Filename :
4134524
Link To Document :
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