DocumentCode :
2042050
Title :
Development of thermal fatigue sensor for electrical and electronic equipment
Author :
Minakata, Y. ; Qiuang Yu ; Takagi, Kazuyoshi
Author_Institution :
Yokohama Nat. Univ., Yokohama, Japan
fYear :
2012
fDate :
13-16 Dec. 2012
Firstpage :
1
Lastpage :
5
Abstract :
In this paper, authors proposed an original sensor which can measure thermal fatigue life of electronic equipment. The measurement principle of the sensor is that the joint was damaged by the stress due to a mismatch of thermal expansion between two materials. Finally, the joint was ruptured by the repeated stress. The priority subject was the feasibility of measurement accuracy of the sensor. Generally, a high level control of failure in joint is very difficult. To solve this problem, authors conceived the original design of the sensor. Then, the availability study of the original sensor for fracture control in joint was carried out using the crack propagation analysis. In the result, a high level control method for failure in joint of the sensor was achieved.
Keywords :
cracks; failure analysis; fracture; temperature sensors; thermal expansion; thermal stress cracking; crack propagation analysis; electrical equipment; electronic equipment; failure analysis; fracture control; high level control method; repeated stress; thermal expansion; thermal fatigue life measurement; thermal fatigue sensor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location :
Lantau Island
Print_ISBN :
978-1-4673-4945-1
Electronic_ISBN :
978-1-4673-4943-7
Type :
conf
DOI :
10.1109/EMAP.2012.6507847
Filename :
6507847
Link To Document :
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