• DocumentCode
    2042130
  • Title

    A theoretical approach for solving the post-fabrication tuning problem

  • Author

    Chang, V.W.W. ; Liu, P.C.K. ; Li, K.C.

  • Author_Institution
    Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong
  • Volume
    2
  • fYear
    1993
  • fDate
    19-21 Oct. 1993
  • Firstpage
    1174
  • Abstract
    Post-fabrication tuning is always necessary in electrical circuits manufacturing to achieve a high percentage yield. Tuning can give good yield at low cost only if the suitable tuning parameters are identified. In this paper, a theoretical approach is proposed to identify those tuning parameters. The approach is implemented in an example and the results match with the predication.<>
  • Keywords
    network analysis; sensitivity analysis; electrical circuits manufacturing; high percentage yield; post-fabrication tuning problem; Circuit optimization; Fabrication; Sensitivity analysis; Statistical distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON '93. Proceedings. Computer, Communication, Control and Power Engineering.1993 IEEE Region 10 Conference on
  • Conference_Location
    Beijing, China
  • Print_ISBN
    0-7803-1233-3
  • Type

    conf

  • DOI
    10.1109/TENCON.1993.320213
  • Filename
    320213
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2042130