Title :
Recording performance of double-layered perpendicular recording media with antiferromagnetic layer
Author :
Watanabe, S. ; Takenoiri, S. ; Sakai, Y. ; Enomoto, K. ; Uwazumi, H.
Author_Institution :
Fuji Electr. Corp. Res. & Dev. Ltd., Nagano, Japan
fDate :
March 30 2003-April 3 2003
Abstract :
In this study, we have investigated the layer structure and the materials of AFML to obtain high exchange bias field H/sub ex/, and also discussed the influence of the H/sub ex/ to the recording performance for double-layered perpendicular media.
Keywords :
antiferromagnetic materials; boron alloys; chromium alloys; cobalt alloys; exchange interactions (electron); ferromagnetic materials; interface structure; iridium alloys; iron alloys; magnetic thin films; manganese alloys; metallic thin films; nickel alloys; niobium alloys; perpendicular magnetic recording; tantalum; zirconium alloys; Ta-NiFeB-IrMn-CoFeNiB-CoZrNb; Ta-NiFeCr-IrMn-CoFe-CoZrNb; antiferromagnetic layer; double-layered perpendicular recording media; exchange bias field; layer structure; Antiferromagnetic materials; Artificial intelligence; Disk recording; Magnetic heads; Magnetic materials; Magnetic recording; Magnetization; Perpendicular magnetic recording; Rapid thermal annealing; Rapid thermal processing;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230296
