Title :
A statistical circuit simulator for designing tunable circuits
Author :
Li, K.C. ; So, K.K. ; Liu, P.C.K.
Author_Institution :
Dept. of Electron. Eng., Hong Kong Polytech., Kowloon, Hong Kong
Abstract :
In this paper, a statistical circuit simulator for the selection of tuning components is described. Using this simulator, a circuit designer can make an appropriate solution on the selection of tuning component as well as an estimate of the yield for manufacturing.<>
Keywords :
circuit analysis computing; designing tunable circuits; manufacturing; statistical circuit simulator; yield; Circuit optimization; Circuit simulation; Costs; Marine vehicles; Performance analysis; Production; Testing; Tunable circuits and devices; Virtual manufacturing; Yield estimation;
Conference_Titel :
TENCON '93. Proceedings. Computer, Communication, Control and Power Engineering.1993 IEEE Region 10 Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-7803-1233-3
DOI :
10.1109/TENCON.1993.320218
