Title :
Kullback-Leibler Distance Optimization for Non-rigid Registration of Echo-Planar to Structural Magnetic Resonance Brain Images
Author :
Gholipour, Ali ; Kehtarnavaz, Nasser ; Briggs, Richard W. ; Gopinath, Kaundinya S.
Author_Institution :
Texas Univ., Richardson
fDate :
Sept. 16 2007-Oct. 19 2007
Abstract :
This paper presents the use of Kullback-Leibler Distance (KLD) as part of an optimization framework to incorporate prior knowledge from field maps into non-rigid registration of echo-planar (EPI) to structural magnetic resonance brain images. An analytical expression is derived for the derivatives of KLD with respect to registration transformation parameters, which is shown to be computationally more efficient as compared to the derivatives of mutual information. Quantitative gold standard validation is carried out on simulated digital brain phantom images with synthesized deformations. In addition, in-vivo validation is performed via a cross-comparison of the similarity of high-resolution and low-resolution EPI to T1-and T2-weighted structural images. The results obtained indicate that the developed KLD-based non-rigid registration technique provides an effective way of correcting local distortions in echo-planar imaging.
Keywords :
biomedical MRI; brain; image registration; image resolution; medical image processing; neurophysiology; phantoms; EPI high-resolution; KLD-based nonrigid registration; Kullback-Leibler distance optimization; digital brain phantom images; echo-planar imaging; in-vivo validation; registration transformation parameter; structural magnetic resonance brain images; Brain modeling; Computational modeling; Deformable models; Gold; High-resolution imaging; Imaging phantoms; Information analysis; Magnetic analysis; Magnetic resonance; Mutual information; Kullback-Leibler Distance; Magnetic Resonance Echo-Planar Imaging; Non-rigid Image Registration;
Conference_Titel :
Image Processing, 2007. ICIP 2007. IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-1437-6
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2007.4379561