Title :
Microstructural analysis of lead-free solder joint under thermo-mechanical loading
Author :
Kuo-Kang Hung ; Mei-Ling Wu
Author_Institution :
Dept. of Mech. & Electro-Mech. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
The influences of thermo-mechanical loadings on BGA´s solder joint are discussed in this paper. Since the thermo-mechanical loading caused by mismatch of coefficient of thermal expansion between different materials is a very common and unavoidable phenomenon in electronic packaging. Many products like mobile phones, PC suffer from this loading. It goes without saying that it´s a problem, especially in a rapid changing temperature cycle, needed to be solved and conquered. The major objectives of this paper is to build up an analytic thermo-mechanical model which is capable of analyzing solder joint´s behaviors such as forces, bending moments and present the results from this model in an effort to provide design reference. The comprehension of solder joint can contribute to make assembly more reliable. The finite element model (FEM) program is chosen as the computational method. What´s more, the method of simulation is equipped with the advantages, including saving time, low costs and so on. We can even predict the reliability of products by a proper model prior to mass production. In general, the solder joint is the key aspect in the whole packaging´s structure. In addition, the difference between lead and lead-free solder joint are also discussed and compared in this paper due to the fact that the demand of environment concerns has been highly considered for the past decades. In this paper, through using the finite element analysis, the model has been established, and the results acquired from analytical model should be applied to FEM predictions.
Keywords :
ball grid arrays; bending; finite element analysis; solders; thermal expansion; BGA solder joint behaviors; FEM program; bending moments; design reference; electronic packaging; finite element model; lead-free solder joint; mass production; microstructural analysis; mobile phones; product reliability; rapid changing temperature cycle; thermal expansion coefficient mismatch; thermomechanical loading;
Conference_Titel :
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location :
Lantau Island
Print_ISBN :
978-1-4673-4945-1
Electronic_ISBN :
978-1-4673-4943-7
DOI :
10.1109/EMAP.2012.6507857