Title :
Micromagnetic calculation of the transverse susceptibility of patterned media
Author :
Spinu, L. ; Cimpoesu, D. ; Stoleriu, L. ; Stancu, A.
Author_Institution :
Dept. of Phys., Univ. of New Orleans, LA, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this paper, we present a generalized model of the transverse susceptibility (TS) for realistic fine particle systems that may have any type of anisotropy (uniaxial,cubic,or unidirectional), distribution of easy axes orientation, particles positions and volumes and different strength of magnetostatic interactions between particles. The field dependence of TS is obtained using a micromagnetic algorithm based on the Landau-Lifshitz-Gilbert equation. For the uniaxial particles, where the critical curve approach can also be used, we have compared the results of the micromagnetic algorithm and those obtained by integration of Aharoni´s formula over the orientation distribution. Tests were also made on the calculation of the TS for single particles with various orientation of the easy axis with respect to the AC/DC applied fields.
Keywords :
magnetic anisotropy; magnetic particles; magnetic susceptibility; magnetostatics; micromagnetics; nickel; numerical analysis; AC/DC applied field effect; Aharonis formula; Landau-Lifshitz-Gilbert equation; Ni; anisotropy; magnetostatic interactions; micromagnetic algorithm; realistic fine particle systems; transverse susceptibility; Anisotropic magnetoresistance; Large Hadron Collider; Magnetic analysis; Magnetic anisotropy; Magnetic domains; Magnetostatics; Micromagnetics; Pattern analysis; Perpendicular magnetic anisotropy; Physics;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230311