DocumentCode :
2042671
Title :
Fabrication of novel self-aligned InP/InGaAs HBTs using dummy emitter
Author :
Kim, Moonjung ; Jeon, Sookun ; Yoon, Myunghoon ; Yang, Kyounghoon ; Kwon, Young-Se
Author_Institution :
Dept. of Electron. Eng. & Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fYear :
2000
fDate :
2000
Firstpage :
351
Lastpage :
354
Abstract :
A novel self-aligned process for InP/InGaAs heterojunction bipolar transistors (HBTs) was developed based on the crystallographic wet etching characteristics of an InP dummy emitter layer. The desired contact spacing between the emitter and the base electrodes was obtained by utilizing consistent undercut profiles of InP layers according to the crystal orientations. The new self-aligned emitter-base technology was found to be very effective not only in maintaining high current gain down to small emitter-size devices, but also in showing good overall device performance at high frequencies. The maximum fT and fmax of the device were measured to be 77 GHz and 115 GHz, respectively.
Keywords :
III-V semiconductors; etching; gallium arsenide; heterojunction bipolar transistors; indium compounds; 115 GHz; 77 GHz; InP-InGaAs; InP/InGaAs heterojunction bipolar transistor; crystal orientation; crystallographic wet etching; current gain; dummy emitter; self-aligned fabrication process; undercut profile; Chemical processes; Crystallography; Cutoff frequency; Electrodes; Electron mobility; Fabrication; Heterojunction bipolar transistors; Indium gallium arsenide; Indium phosphide; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2000. COMMAD 2000. Proceedings Conference on
Print_ISBN :
0-7803-6698-0
Type :
conf
DOI :
10.1109/COMMAD.2000.1022962
Filename :
1022962
Link To Document :
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