• DocumentCode
    2042989
  • Title

    Defects density distribution of AIN films produced by RF sputtering in argon-nitrogen-hydrogen mixture

  • Author

    Ligatchev, V. ; Yoon, S.F. ; Ahn, J. ; Zhang, Q. ; Rusli

  • Author_Institution
    Nanyang Technological University
  • fYear
    2000
  • fDate
    6-8 Dec. 2000
  • Firstpage
    387
  • Lastpage
    390
  • Keywords
    Conductivity; Deconvolution; Molecular beam epitaxial growth; Optical films; Radio frequency; Silicon; Sputtering; Substrates; Temperature; US Department of Defense;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronic and Microelectronic Materials and Devices, 2000. COMMAD 2000. Proceedings Conference on
  • Conference_Location
    Bundoora, Victoria, Australia
  • Print_ISBN
    0-7803-6698-0
  • Type

    conf

  • DOI
    10.1109/COMMAD.2000.1022971
  • Filename
    1022971