Title :
Electron Emission Properties of Diamond Nanocones on Freestanding Diamond Films
Author :
Gu, C.Z. ; Wang, Q. ; Wang, Z.L. ; Li, J.J.
Author_Institution :
Inst. of Phys., Chinese Acad. of Sci., Beijing
Abstract :
Large-area diamond conical nanostructure arrays were formed on freestanding diamond films using a hot filament chemical vapor deposition system with negative biasing of the substrates. Results of scanning electron microscopy and transmission electron microscopy studies showed that the energetic methylic ions during the self-organized selective sputtering process dominantly contribute to the formation of diamond cone arrays with controlled morphology based on a neutral-ion charge exchange collision model. Field emission properties, measured by a home-made double probe scanning electron microscopy, presented lower threshold voltage and higher emission current density compared with those of planar diamond films. This study has opened the possibility of using diamond cone arrays as display device and point electron source with excellent electron emission ability
Keywords :
CVD coatings; diamond; electron field emission; nanostructured materials; scanning electron microscopy; sputtered coatings; transmission electron microscopy; C; diamond nanocone arrays; display device; double probe scanning electron microscopy; electron field emission properties; emission current density; energetic methylic ions; freestanding diamond films; hot filament chemical vapor deposition; morphological properties; negative substrate biasing; neutral-ion charge exchange collision model; point electron source; self-organized selective sputtering; threshold voltage; transmission electron microscopy; Chemical vapor deposition; Current measurement; Density measurement; Electron emission; Morphology; Probes; Scanning electron microscopy; Sputtering; Threshold voltage; Transmission electron microscopy;
Conference_Titel :
Vacuum Nanoelectronics Conference, 2006 and the 2006 50th International Field Emission Symposium., IVNC/IFES 2006. Technical Digest. 19th International
Conference_Location :
Guilin
Print_ISBN :
1-4244-0401-0
DOI :
10.1109/IVNC.2006.335472