Title :
An investigation on secondary EFO copper wire - from a nanoscale perspective view
Author :
Hsiang-Chen Hsu ; Jih-Hsin Chien ; Chen-Yi Wang ; Cheng-Che Liu ; Shen-Li Fu ; Bair, M.S.
Author_Institution :
Dept. of Mech. & Autom. Eng., I-Shou Univ., Kaohsiung, Taiwan
Abstract :
The aim of present research is to investigate the characteristic of secondary EFO (electronic flame-off) Pd-coated copper wire. The term of “secondary” is twice EFO performed by a bonding apparatus, K&S 1488 wire bonder. As a result, secondary EFO Cu wire demonstrates a longer heat affected zone (HAZ) and a softer free air ball (FAB) which results in a decrease in the squeeze of aluminum bond pad. It is also observed that the surface roughness is a major factor to reduce the aluminum pad squeezing. The interfacial coefficient of frictional force at a nanoscale surface level was measured by Atomic Force Microscopy (AFM). The coefficient of frictional force needs to measure both the normal force (corresponds to loading force-distance curve) and a lateral force (corresponds to friction force) on a sliding contact. In addition, mechanical property of FAB surface on Pd-coated copper wire was determined by nanoindenter. A well-defined contact area is measured to study the frictional force and friction stress. Thermal aging effect has been conducted to reduce the strength of Cu wire and increase the reliability. The study of roughness parameters corresponds to evaluate the friction and the interfacial strengths. Local variation in nano tribology is also measured. Nanotribology is crucial in describing manipulations of molecules behavior. The measured surface topography (3D profiles) are then applied to determinate the potential energy in molecular dynamic (MD) method to study the atomic scale frictional interactions. A series of experimental works and MD predictions are conducted to investigate the interfacial behavior along the Cu FAB and Al Pad.
Keywords :
ageing; atomic force microscopy; copper alloys; electrical contacts; flames; integrated circuit packaging; lead bonding; molecular dynamics method; nanotechnology; palladium; reliability; surface roughness; tribology; wires; 3D profiles; AFM; FAB surface; HAZ; IC packaging; K&S 1488 wire bonder; MD method; Pd-Cu; aluminum bond pad; aluminum pad squeezing reduction; atomic force microscopy; atomic scale frictional interactions; bonding apparatus; coefficient of frictional force; contact area; copper wirebonding process; electronic flame-off palladium-coated copper wire; friction stress; heat affected zone; interfacial coefficient; interfacial strengths; lateral force; measured surface topography; mechanical property; molecular dynamic method; nanoindenter; nanoscale surface level; nanotribology; reliability; secondary EFO; secondary EFO copper wire; sliding contact; softer free air ball; surface roughness; thermal aging effect; Pd-coated Copper wire; molecular dynamics; nanotribology; secondary EFO;
Conference_Titel :
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location :
Lantau Island
Print_ISBN :
978-1-4673-4945-1
Electronic_ISBN :
978-1-4673-4943-7
DOI :
10.1109/EMAP.2012.6507897