Title :
Eliminating harmful redundancy for testing-based fault localization using test suite reduction: an experimental study
Author :
Hao, Dan ; Zhang, Lu ; Zhong, Hao ; Mei, Hong ; Sun, Jiasu
Author_Institution :
Sch of Electron. Eng. & Comput. Sci., Peking Univ., Beijing, China
Abstract :
In the process of software maintenance, it is usually a time-consuming task to track down bugs. To reduce the cost on debugging, several approaches have been proposed to localize the fault(s) to facilitate debugging. Intuitively, testing-based fault localization (TBFL), such as dicing and TRANTULA, is quite promising as it can take the advantage of a large set of execution traces at the same time. However, redundant test cases may bias the distribution of the test suite and harm this kind of approaches. Therefore, we suggest that the test suite, which is the input of TBFL, should be reduced before used in TBFL. To evaluate whether and to what extent TBFL can benefit from test suite reduction, we performed an experimental study on two source programs. The experimental results show that, for test suites containing unevenly distributed redundant test cases, performing test suite reduction before applying TBFL may be more advantageous.
Keywords :
program debugging; program testing; software maintenance; program debugging; redundant test case; software maintenance; test suite reduction; testing-based fault localization; Automatic testing; Computer bugs; Computer science; Electronic equipment testing; Performance evaluation; Redundancy; Software debugging; Software maintenance; Software testing; Sun;
Conference_Titel :
Software Maintenance, 2005. ICSM'05. Proceedings of the 21st IEEE International Conference on
Print_ISBN :
0-7695-2368-4
DOI :
10.1109/ICSM.2005.43