DocumentCode :
2043466
Title :
Eliminating harmful redundancy for testing-based fault localization using test suite reduction: an experimental study
Author :
Hao, Dan ; Zhang, Lu ; Zhong, Hao ; Mei, Hong ; Sun, Jiasu
Author_Institution :
Sch of Electron. Eng. & Comput. Sci., Peking Univ., Beijing, China
fYear :
2005
fDate :
26-29 Sept. 2005
Firstpage :
683
Lastpage :
686
Abstract :
In the process of software maintenance, it is usually a time-consuming task to track down bugs. To reduce the cost on debugging, several approaches have been proposed to localize the fault(s) to facilitate debugging. Intuitively, testing-based fault localization (TBFL), such as dicing and TRANTULA, is quite promising as it can take the advantage of a large set of execution traces at the same time. However, redundant test cases may bias the distribution of the test suite and harm this kind of approaches. Therefore, we suggest that the test suite, which is the input of TBFL, should be reduced before used in TBFL. To evaluate whether and to what extent TBFL can benefit from test suite reduction, we performed an experimental study on two source programs. The experimental results show that, for test suites containing unevenly distributed redundant test cases, performing test suite reduction before applying TBFL may be more advantageous.
Keywords :
program debugging; program testing; software maintenance; program debugging; redundant test case; software maintenance; test suite reduction; testing-based fault localization; Automatic testing; Computer bugs; Computer science; Electronic equipment testing; Performance evaluation; Redundancy; Software debugging; Software maintenance; Software testing; Sun;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Software Maintenance, 2005. ICSM'05. Proceedings of the 21st IEEE International Conference on
ISSN :
1063-6773
Print_ISBN :
0-7695-2368-4
Type :
conf
DOI :
10.1109/ICSM.2005.43
Filename :
1510173
Link To Document :
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