DocumentCode
2043481
Title
Effect of matrix on InAs self-organized nanostructures on InP substrate
Author
Zhuang, Q.D. ; Yoon, S.F. ; Zheng, H.Q.
Author_Institution
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore
fYear
2000
fDate
2000
Firstpage
455
Lastpage
458
Abstract
We report the influence of the matrix in InAs nanostructures grown on InP[001] substrates by solid source molecular beam epitaxy. Three buffers of InGaAs, InAlAs, and InP lattice matched on InP have been studied. Differences in nanostructure morphology have been evaluated by atomic force microscopy and by low-temperature photoluminescence measurements. We have observed quantum wire formation in the InAs/InGaAs and InAs/InAlAs system, while quantum dots with bimodal size distribution appeared in the InAs/InP system. The observed drastic modification of nanostructures is attributed to the anisotropic buffer layer surface, and the bimodal size distribution of InAs quantum dots on InP buffer is simply explained by the surface mass transfer.
Keywords
III-V semiconductors; atomic force microscopy; indium compounds; nanostructured materials; photoluminescence; semiconductor epitaxial layers; semiconductor quantum dots; semiconductor quantum wires; InAlAs; InAs; InGaAs; InP; InP substrate; anisotropic buffer layer surface; atomic force microscopy; morphology; photoluminescence; quantum dots; quantum wire formation; self-organized nanostructures; solid source molecular beam epitaxy; surface mass transfer; Atomic force microscopy; Atomic measurements; Force measurement; Indium compounds; Indium gallium arsenide; Indium phosphide; Nanostructures; Quantum dots; Substrates; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Optoelectronic and Microelectronic Materials and Devices, 2000. COMMAD 2000. Proceedings Conference on
Print_ISBN
0-7803-6698-0
Type
conf
DOI
10.1109/COMMAD.2000.1022988
Filename
1022988
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