Title :
Power system transient stability-constrained optimal power flow: A comprehensive review
Author :
Yan Xu ; Zhao Yang Dong ; Zhao Xu ; Rui Zhang ; Kit Po Wong
Author_Institution :
Centre for Intell. Electr. Networks (CIEN), Univ. of Newcastle, Callaghan, NSW, Australia
Abstract :
Transient stability-constrained optimal power flow (TSC-OPF) simultaneously considers static and dynamic constraints of the power system when optimizing the operating variables. It has become a widely adopted tool for power system preventive control against blackouts triggered by transient instability. But due to the high non-linear inherence of system dynamics, the solving of TSC-OPF is very tricky. In literature, various methods have been proposed for identifying the most effective solution to TSC-OPF. This paper conducts a comprehensive review on the state-of-the-art methods reported in literature, aiming to provide more valuable insights into this area. At first, the mathematical model of TSC-OPF is revisited. Subsequently, the difficulties of solving TSC-OPF are identified, and the methods are classified into three categories, the detailed review, comments and discussions are then given, covering their philosophy, computation procedures, merits and demerits, and possible improvement directions. Finally, the simulation results on some common testing systems by the methods are shown for more distinct illustrations of the methods.
Keywords :
load flow control; mathematical analysis; optimal control; power system control; power system dynamic stability; power system reliability; power system transient stability; TSC-OPF; constrained optimal power flow; high nonlinear inherence; mathematical model; power blackout; power system dynamic transient stability; power system preventive control; testing system; Mathematical model; Numerical stability; Power system stability; Stability criteria; Transient analysis; optimal power flow; preventive control; transient stability;
Conference_Titel :
Power and Energy Society General Meeting, 2012 IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-2727-5
Electronic_ISBN :
1944-9925
DOI :
10.1109/PESGM.2012.6344753