• DocumentCode
    2043859
  • Title

    Anomaly detection for chromaticity shift of high power white LED with mahalanobis distance approach

  • Author

    Jiajie Fan ; Kam-Chuen Yung ; Pecht, Michael

  • Author_Institution
    Dept. of Ind. & Syst. Eng., Hong Kong Polytech. Univ., Hong Kong, China
  • fYear
    2012
  • fDate
    13-16 Dec. 2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    High power white LED (HPWLED) with the benefits of high efficiency, small size, lower power consumption and high reliability has been commercially used as a substitute of the traditional white light sources in the application of general lighting systems, monitor backlighting and so on. Nowadays, in the LED´s reliability field, many previous researches paid attentions only on the lumen depreciation failure in LED products, ignoring another common failure mode called chromaticity shift. In this paper, we used a data-driven method based on a multivariate distance measure, Mahalanobis distance (MD), to detect the chromaticity shift anomaly of HPWLED after aging test. The result shows that by dealing MD distributions with Weibull statistical model, a chromaticity anomaly alarm indicator can be established to detect anomaly of chromaticity shift before HPWLED failed.
  • Keywords
    Weibull distribution; ageing; light emitting diodes; reliability; HPWLED products; LED reliability field; MD distributions; Mahalanobis distance approach; Weibull statistical model; aging test; anomaly detection; chromaticity anomaly alarm indicator; chromaticity shift; common failure mode; data-driven method; high power white LED; high power white light emitting diodes; lighting systems; lumen depreciation failure; monitor backlighting; multivariate distance measure; reliability; white light sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
  • Conference_Location
    Lantau Island
  • Print_ISBN
    978-1-4673-4945-1
  • Electronic_ISBN
    978-1-4673-4943-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2012.6507916
  • Filename
    6507916