Title :
Sensitivity analysis of simulations for magnetic particle inspection using finite element method
Author :
Lee, J.Y. ; Lee, S.J. ; Jiles, David C. ; Garton, M. ; Lopez, R. ; Brasche, L.
Author_Institution :
Center for Aviation Syst. Reliability, Iowa State Univ., Ames, IA, USA
fDate :
March 30 2003-April 3 2003
Abstract :
In this article, we report a sensitivity analysis of numerical simulations of MPI for defects with various sizes using the finite element analysis (FEM).
Keywords :
finite element analysis; magnetic particles; nondestructive testing; sensitivity analysis; FEM; finite element analysis; magnetic particle inspection; numerical simulations; sensitivity analysis; Analytical models; Computational modeling; Equations; Finite element methods; Inspection; Magnetic analysis; Magnetic fields; Magnetic materials; Magnetic particles; Sensitivity analysis;
Conference_Titel :
Magnetics Conference, 2003. INTERMAG 2003. IEEE International
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-7647-1
DOI :
10.1109/INTMAG.2003.1230358
