DocumentCode :
2043989
Title :
Model of high-intensity local influence of microwave radiation on semiconductor layered structures
Author :
Gordienko, Yu.E. ; Slipchenko, N.I. ; Taran, E.P.
Author_Institution :
Kharkov Nat. Univ. of Radioelectron., Kharkov, Ukraine
fYear :
2013
fDate :
8-14 Sept. 2013
Firstpage :
916
Lastpage :
917
Abstract :
The numerical model of local high-local influence of microwave radiation on semiconductor structures is presented. The electrodynamic part of the model is constructed with use of a method of FDTD with an adaptive spatial grid. At creation of thermal part the method of independent thermal streams was used. Distributions of electromagnetic and temperature fields in semiconductor structure which allow determining the characteristic sizes of local sites with increased temperature in semiconductor structures under the influence of electromagnetic fields of microwave range are obtained.
Keywords :
electromagnetic waves; finite difference time-domain analysis; FDTD; adaptive spatial grid; electromagnetic; high intensity local influence; independent thermal streams; microwave radiation; microwave range; numerical model; semiconductor layered structures; semiconductor structures; temperature fields; Educational institutions; Finite difference methods; Microwave theory and techniques; Numerical models; Semiconductor device modeling; Temperature distribution; Time-domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2013 23rd International Crimean Conference
Conference_Location :
Sevastopol
Print_ISBN :
978-966-335-395-1
Type :
conf
Filename :
6653124
Link To Document :
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