• DocumentCode
    2043999
  • Title

    Influence of high DC electrical fields on some aging properties of XLPE

  • Author

    Crine, Jean-Pierre

  • Author_Institution
    Technol. Consultant, Brossard, Que., Canada
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    101
  • Lastpage
    104
  • Abstract
    The influence of high DC electrical fields (above 40 kV/mm) on some electrical properties and on the morphology of polyethylene (PE) is discussed from published experimental data. As it is well known, the polarization currents obtained under such fields are controlled by space charges. It is then possible to deduce the electrons mobility and concentration as a function of field. We show that the charge concentration thus calculated is in excellent agreement with space charge measurements performed with a modern and sophisticated equipment. The same calculation shows that the significance of the so-called thresholds fields is, at best, debatable. Old polarization measurements predicting recent observations of very strong charge injection are also briefly discussed. IR and positron spectroscopy measurements as well as capacitance measurements tend to suggest that the polymer morphology is modified by high fields. The possible relation with the submicrocavity formation proposed in our aging model is discussed
  • Keywords
    XLPE insulation; ageing; charge injection; dielectric polarisation; electron density; electron mobility; polymer structure; space charge; DC electrical field; IR spectroscopy; XLPE; aging; capacitance; charge injection; electrical properties; electron concentration; electron mobility; polarization current; polyethylene; polymer morphology; positron spectroscopy; space charge; Aging; Capacitance measurement; Charge measurement; Current measurement; Electron mobility; Morphology; Performance evaluation; Polarization; Polyethylene; Space charge;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
  • Conference_Location
    Anaheim, CA
  • ISSN
    1089-084X
  • Print_ISBN
    0-7803-5931-3
  • Type

    conf

  • DOI
    10.1109/ELINSL.2000.845456
  • Filename
    845456