DocumentCode
2043999
Title
Influence of high DC electrical fields on some aging properties of XLPE
Author
Crine, Jean-Pierre
Author_Institution
Technol. Consultant, Brossard, Que., Canada
fYear
2000
fDate
2000
Firstpage
101
Lastpage
104
Abstract
The influence of high DC electrical fields (above 40 kV/mm) on some electrical properties and on the morphology of polyethylene (PE) is discussed from published experimental data. As it is well known, the polarization currents obtained under such fields are controlled by space charges. It is then possible to deduce the electrons mobility and concentration as a function of field. We show that the charge concentration thus calculated is in excellent agreement with space charge measurements performed with a modern and sophisticated equipment. The same calculation shows that the significance of the so-called thresholds fields is, at best, debatable. Old polarization measurements predicting recent observations of very strong charge injection are also briefly discussed. IR and positron spectroscopy measurements as well as capacitance measurements tend to suggest that the polymer morphology is modified by high fields. The possible relation with the submicrocavity formation proposed in our aging model is discussed
Keywords
XLPE insulation; ageing; charge injection; dielectric polarisation; electron density; electron mobility; polymer structure; space charge; DC electrical field; IR spectroscopy; XLPE; aging; capacitance; charge injection; electrical properties; electron concentration; electron mobility; polarization current; polyethylene; polymer morphology; positron spectroscopy; space charge; Aging; Capacitance measurement; Charge measurement; Current measurement; Electron mobility; Morphology; Performance evaluation; Polarization; Polyethylene; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation, 2000. Conference Record of the 2000 IEEE International Symposium on
Conference_Location
Anaheim, CA
ISSN
1089-084X
Print_ISBN
0-7803-5931-3
Type
conf
DOI
10.1109/ELINSL.2000.845456
Filename
845456
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