DocumentCode
2044108
Title
Pressureless low temperature sintering of Ag nanoparticles for interconnects
Author
Shuai Wang ; Hongjun Ji ; Mingyu Li ; Jongmyung Kim ; Hongbae Kim
Author_Institution
Shenzhen Grad. Sch., Harbin Inst. of Technol., Shenzhen, China
fYear
2012
fDate
13-16 Dec. 2012
Firstpage
1
Lastpage
4
Abstract
Cu-to-Cu interconnects were achieved by pressureless low temperature sintering of Ag nanoparticles for electronic packaging. Ag nanoparticles could be sintered so long as the chemical bonds by which organic shells connected with Ag nanoparticles were broken with no necessity that organic shells completely decomposed, which provided a way to lower bonding temperature. The pinecone-like recrystallization morphology of sintering Ag nanoparticles was observed by transmission electron microscopy, which resulted from the residuals of organic shells by sintering process. The thermal conductivity of sintered Ag nanoparticles was affected strongly by the recrystallization morphology because of grain boundary scattering effect. The shear strengths of joints reached 17-25 MPa at temperatures ranging from 150 °C to 200 °C.
Keywords
crystal morphology; electronics packaging; grain boundaries; interconnections; nanoelectronics; nanoparticles; recrystallisation; shear strength; silver; sintering; thermal conductivity; transmission electron microscopy; Ag; bonding temperature; chemical bonds; copper-to-copper interconnects; electronic packaging; grain boundary scattering effect; organic shells; pinecone-like recrystallization morphology; pressureless low-temperature sintering; shear strengths; silver nanoparticles; temperature 150 degC to 200 degC; thermal conductivity; transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
Conference_Location
Lantau Island
Print_ISBN
978-1-4673-4945-1
Electronic_ISBN
978-1-4673-4943-7
Type
conf
DOI
10.1109/EMAP.2012.6507926
Filename
6507926
Link To Document