• DocumentCode
    2044108
  • Title

    Pressureless low temperature sintering of Ag nanoparticles for interconnects

  • Author

    Shuai Wang ; Hongjun Ji ; Mingyu Li ; Jongmyung Kim ; Hongbae Kim

  • Author_Institution
    Shenzhen Grad. Sch., Harbin Inst. of Technol., Shenzhen, China
  • fYear
    2012
  • fDate
    13-16 Dec. 2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Cu-to-Cu interconnects were achieved by pressureless low temperature sintering of Ag nanoparticles for electronic packaging. Ag nanoparticles could be sintered so long as the chemical bonds by which organic shells connected with Ag nanoparticles were broken with no necessity that organic shells completely decomposed, which provided a way to lower bonding temperature. The pinecone-like recrystallization morphology of sintering Ag nanoparticles was observed by transmission electron microscopy, which resulted from the residuals of organic shells by sintering process. The thermal conductivity of sintered Ag nanoparticles was affected strongly by the recrystallization morphology because of grain boundary scattering effect. The shear strengths of joints reached 17-25 MPa at temperatures ranging from 150 °C to 200 °C.
  • Keywords
    crystal morphology; electronics packaging; grain boundaries; interconnections; nanoelectronics; nanoparticles; recrystallisation; shear strength; silver; sintering; thermal conductivity; transmission electron microscopy; Ag; bonding temperature; chemical bonds; copper-to-copper interconnects; electronic packaging; grain boundary scattering effect; organic shells; pinecone-like recrystallization morphology; pressureless low-temperature sintering; shear strengths; silver nanoparticles; temperature 150 degC to 200 degC; thermal conductivity; transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging (EMAP), 2012 14th International Conference on
  • Conference_Location
    Lantau Island
  • Print_ISBN
    978-1-4673-4945-1
  • Electronic_ISBN
    978-1-4673-4943-7
  • Type

    conf

  • DOI
    10.1109/EMAP.2012.6507926
  • Filename
    6507926